PI 500 S

Plano Sub-Aperture Stitching Interferometer System

Full aperture ≤ 600 mmPlano sub-aperture stitching system

Highlights

Built for the production floor.

precise vertical interferometer for testing flat optical components in full aperture up to diameter/diagonal 600mm
integrated, granite based, air-bearing provides precise and maintenance free horizontal and rotational motion
easy to operate Tip-/Tilt setting for fringes adjustment
automatic stitching pattern calculation according to workpiece shape and size
electronic positioning for sub-aperture measurements using electronic controlled C and Y axis
precision, vibration dampened measuring table made of natural granite with high flatness for accurate analysis
adjustable interferometer height for setting best position for different workpiece thicknesses
XONOX X-fiz 150 (6") high performance phaseshifting Fizeau interferometer with 5MPX CMOS camera, stabilized diode laser and electronic control of zoom, focus and contrast
innovative, powerful and user friendly fringe analysis system X-fringe PS2 with different smart and intelligent modes to suit various applications in non-stitching operation
sub-aperture stitching software package for X-Fringe PS2 allowing full aperture analysis of large flat optical surfaces by combining a calculated number of sub-aperture measurements to a full surface analysis

Technical data